AFM and Acoustics: Fast, Quantitative Nanomechanical Mapping

Combining atomic force microscopy and ultrasonic methods allows near-field detection of acoustic signals and thereby otherwise inaccessible nanoscale mechanical characterization. The two predominant variations, ultrasonic force microscopy and atomic force acoustic microscopy, are reviewed in detail. Applications of each to ceramics, polymers, metals, biological materials, and even subsurface structures are discussed, with a particular emphasis on image contrast mechanisms, data analysis, and experimental challenges. Finally, recent advances of these concepts into high-speed surface property mapping are presented, demonstrating 100-fold enhancements in full-frame imaging speeds.