Abstract
Annual Review of Physical Chemistry
Vol. 57:
65-103
(Volume publication date May 2006)
(doi:10.1146/annurev.physchem.57.032905.104748)
4D ULTRAFAST ELECTRON DIFFRACTION, CRYSTALLOGRAPHY, AND MICROSCOPY Ahmed H. ZewailLaboratory for Molecular Sciences and Physical Biology Center for Ultrafast Science and Technology, California Institute of Technology, Pasadena, California 91125; email: zewail@caltech.edu ▪ Abstract In this review, we highlight the progress made in the development of 4D ultrafast electron diffraction (UED), crystallography (UEC), and microscopy (UEM) with a focus on concepts, methodologies, and prototypical applications. The joint atomic-scale resolutions in space and time, and sensitivity reached, make it possible to determine complex transient structures and assemblies in different phases. These applications include studies of isolated chemical reactions (molecular beams), interfaces, surfaces and nanocrystals, self-assembly, and 2D crystalline fatty-acid bilayers. In 4D UEM, we are now able, using timed, single-electron packets, to image nano-to-micro scale structures of materials and biological cells. Future applications of these methods are foreseen across areas of physics, chemistry, and biology. Most recent citing papers (via CrossRef)4D Electron Diffraction Reveals Correlated Unidirectional Behavior in Zinc Oxide Nanowires Science 321(5896):1660-1664 (2008) Direct Observation of Optically Induced Transient Structures in Graphite Using Ultrafast Electron Crystallography Physical Review Letters 101(7) (2008) 4D visualization of embryonic, structural crystallization by single-pulse microscopy Proceedings of the National Academy of Sciences 105(25):8519-8524 (2008) Photovoltage dynamics of the hydroxylated Si(111) surface investigated by ultrafast electron diffraction Physical Review B 77(24) (2008) Proposed method for measuring the duration of electron pulses by attosecond streaking Physical Review A 77(4) (2008)
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